| Wavelength Range |
190.0 ~ 1100.0 nm |
| Display wavelength |
0.1 nm step |
| Selectable wavelength |
0.1 nm step (1nm step in spectrum mode) |
| Scan Speed |
Wavelength Change: Approximately 3800 nm/min
Scan: Approximately 24-1400 nm/min |
| Light Source Change |
Selectable from following 3 types:
Auto change with wavelength
Selectable wavelength 259 nm~364 nm: 1 nm interval
Recommended wavelength: 340 nm
Halogen lamp only
Deuterium (D2) lamp only |
| Measurement Method |
Single beam measurement |
| Light Source |
Auto Correction with the computer memory
20W Halogen Lamp (long life - 2000 hrs)
Deuterium lamp (socket type)
Auto adjustment for maximum sensitivity |
| Monochromator |
Incorporates aberration-correcting concave blazed holographic
grating. |
| Detector |
Silicon photodiode |
| Spectrum bandwidth |
5 nm |
| Wavelength accuracy |
± 1.0 nm |
| Wavelength repeatability |
± 0.3 nm |
| Stray light |
Less than 0.05 %
(220.0 nm Nal, 340.0 nm NaNO2 & UV39) |
| Photometric range |
Absorbance: -0.3~3.0 Abs
Transmittance: 0.0 ~ 200 % |
| Recording range |
Absorbance: -3.99 ~ 3.99 Abs
Transmittance: -399 ~ 399 % |
| Photometric Accuracy |
± 0.005 Abs (at 1.0 Abs) NIST 930D filter
± 0.003 Abs (at 0.5 Abs) |
| Photometric repeatability |
± 0.002 Abs (at 1.0 Abs) |
| Drift |
less than ± 0.001 Abs/h (after 2 hr warm-up) |
| Baseline flatness |
± 0.010 Abs |
| Noise |
less than 0.002 Abs, Peak to Peak
less than 0.0005 Abs, RMS |
| Sample compartment |
Interior dimensions W110.0 x D230.0 x H105.0 nm
(Partial depth: 155.0 nm)
2 screw port for option accessory installation |
| Display |
6 inch LCD (320 x 240 dot) with CFD lighting with contrast adjustment |
| Power Supply |
100 ~ 120 V 50/60 Hz 160 VA
220 ~ 240 V 50/60 Hz 160 VA |
| Dimensions |
W416 x D379 x H247 mm |
| Weight |
11 kg |
| Ambient temperature |
15 ~ 35 °C |
| Ambient humidity |
45 ~ 80 % less than 70 % if over 30 °C |